Incipient Fault Diagnosis of a Grid-Connected T-Type Multilevel Inverter Using Multilayer Perceptron and Walsh Transform

Tito G. Amaral, Vitor Fernão Pires (), Armando Cordeiro, Daniel Foito, João F. Martins, Julia Yamnenko, Tetyana Tereschenko, Liudmyla Laikova and Ihor Fedin
Additional contact information
Tito G. Amaral: ESTSetúbal, Istituto Politécnico de Setúbal, 2914-508 Setúbal, Portugal
Vitor Fernão Pires: ESTSetúbal, Istituto Politécnico de Setúbal, 2914-508 Setúbal, Portugal
Armando Cordeiro: Sustain.RD, IPS—Instituto Politécnico de Setúbal, 2914-508 Setúbal, Portugal
Daniel Foito: ESTSetúbal, Istituto Politécnico de Setúbal, 2914-508 Setúbal, Portugal
João F. Martins: Department of Superior Technical School of Setúbal, Polytechnic Institute of Setúbal, CTS-UNINOVA—Universidade Nova de Lisboa, 1099-085 Lisboa, Portugal
Julia Yamnenko: Faculty of Electronics, National Technical University of Ukraine, 03056 Kyiv, Ukraine
Tetyana Tereschenko: Faculty of Electronics, National Technical University of Ukraine, 03056 Kyiv, Ukraine
Liudmyla Laikova: Faculty of Electronics, National Technical University of Ukraine, 03056 Kyiv, Ukraine
Ihor Fedin: Faculty of Electronics, National Technical University of Ukraine, 03056 Kyiv, Ukraine

Energies, 2023, vol. 16, issue 6, 1-18

Abstract: This article deals with fault detection and the classification of incipient and intermittent open-transistor faults in grid-connected three-level T-type inverters. Normally, open-transistor detection algorithms are developed for permanent faults. Nevertheless, the difficulty to detect incipient and intermittent faults is much greater, and appropriate methods are required. This requirement is due to the fact that over time, its repetition may lead to permanent failures that may lead to irreversible degradation. Therefore, the early detection of these failures is very important to ensure the reliability of the system and avoid unscheduled stops. For diagnosing these incipient and intermittent faults, a novel method based on a Walsh transform combined with a multilayer perceptron ( MLP )-based classifier is proposed in this paper. This non-classical approach of using the Walsh transform not only allows accurate detections but is also very fast. This last characteristic is very important in these applications due to their practical implementation. The proposed method includes two main steps. First, the acquired AC currents are used by the control system and processed using the Walsh transform. This results in detailed information used to potentially identify open-transistor faults. Then, such information is processed using the MLP to finally determine whether a fault is present or not. Several experiments are conducted with different types of incipient transistor faults to create a relevant dataset.

Keywords: artificial neural networks ( ANNs ); Walsh transform; fault diagnosis; incipient and intermittent fault; open transistor; multilevel T-type inverter (search for similar items in EconPapers)
JEL-codes: Q Q0 Q4 Q40 Q41 Q42 Q43 Q47 Q48 Q49 (search for similar items in EconPapers)
Date: 2023
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