Effect of Thickness on the Breakdown Characteristics of Organic Insulation Materials under Microsecond Pulse Voltage

Xudong Li, Xin Liu, Jiasheng Ru, Zhibin Zeng, Haoran Bian, Yuefang Li (), Hua Zhong and Lei Chen
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Xudong Li: Institute of Electronic Engineering, China Academy of Engineering Physics, Mianyang 621999, China
Xin Liu: Institute of Electronic Engineering, China Academy of Engineering Physics, Mianyang 621999, China
Jiasheng Ru: Institute of Electronic Engineering, China Academy of Engineering Physics, Mianyang 621999, China
Zhibin Zeng: Institute of Electronic Engineering, China Academy of Engineering Physics, Mianyang 621999, China
Haoran Bian: Institute of Electronic Engineering, China Academy of Engineering Physics, Mianyang 621999, China
Yuefang Li: Institute of Electronic Engineering, China Academy of Engineering Physics, Mianyang 621999, China
Hua Zhong: Institute of Electronic Engineering, China Academy of Engineering Physics, Mianyang 621999, China
Lei Chen: Institute of Electronic Engineering, China Academy of Engineering Physics, Mianyang 621999, China

Energies, 2024, vol. 17, issue 14, 1-14

Abstract: Thickness affects the electrical breakdown strength (E BD ) of insulation materials, and the variation of E BD with thickness (d) is an important basis for insulation design. In this paper, the effect of d on three kinds of organic insulation materials (OIMs), namely polymethyl methacrylate (PMMA), polyetheretherketone (PEEK), and polyethylene terephthalate (PET), on their breakdown characteristics under microsecond pulse voltage (MSPV) was studied, and a breakdown probability prediction model was established based on Weibull distribution. The breakdown mechanisms of the OIMs under MSPV were also discussed. The results showed that the E BD of all three materials decreased with increasing d. The relationship between characteristic E BD and d all satisfied the inverse power model, and their inverse power coefficients were all close to 1/2.3, which was much larger than 1/8 for that under nanosecond pulse voltage. A general breakdown probability prediction model of the OIMs was established by combining the Weibull distribution and β = 2.3 so as to guide engineering design in the absence of basic test data under MSPV. The breakdown mechanism of the OIMs under MSPV was an energy-related composite physical breakdown mechanism, which was verified by analysis of energy accumulation characteristics and experimental evidence of the little influence of pulse width on E BD under MSPV. The research results lay the foundation for the insulation design and further study on the breakdown modeling of OIM under MSPV.

Keywords: microsecond pulse voltage; thickness; organic insulation material; breakdown characteristics; energy accumulation characteristics (search for similar items in EconPapers)
JEL-codes: Q Q0 Q4 Q40 Q41 Q42 Q43 Q47 Q48 Q49 (search for similar items in EconPapers)
Date: 2024
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