In-Plane Liftout and Push-to-Pull for In Situ Mechanical Testing of Irradiated Inconel X-750

Lucia R. Gomez-Hurtado, Tiankai Yao, Fei Teng, Mario D. Matos, Laura Hawkins, Ge Yang and Yachun Wang ()
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Lucia R. Gomez-Hurtado: Idaho National Laboratory, Idaho Falls, ID 83415, USA
Tiankai Yao: Idaho National Laboratory, Idaho Falls, ID 83415, USA
Fei Teng: Idaho National Laboratory, Idaho Falls, ID 83415, USA
Mario D. Matos: Idaho National Laboratory, Idaho Falls, ID 83415, USA
Laura Hawkins: Idaho National Laboratory, Idaho Falls, ID 83415, USA
Ge Yang: Department of Nuclear Engineering, North Carolina State University, Raleigh, NC 27695, USA
Yachun Wang: Idaho National Laboratory, Idaho Falls, ID 83415, USA

Energies, 2024, vol. 17, issue 17, 1-13

Abstract: A streamlined sample preparation method for nanomechanical testing is needed to improve the quality of specimens, reduce the cost, and increase the versatility of specimen fabrication. This work outlines an in-plane liftout focused ion beam (FIB) fabrication procedure to prepare electron-transparent specimens for in situ transmission electron microscopy (TEM) nanomechanical testing. Ion etching and electron backscatter diffraction (EBSD) techniques were used to lift out a [110] oriented grain from a neutron-irradiated bulk X-750 alloy. Careful control of voltages and currents ensured precision. Top surface thinning sweeps prevented resurfacing and redeposition while dog-bone geometries were shaped with a 1:4 gauge width-to-milling pattern diameter ratio. Nanotensile testing in the TEM with a picoindenter allowed for the estimation of an ultimate tensile strength of 2.41 GPa, and inspection revealed a high density of bubbles in the X-750 matrix. The proposed fabrication procedure is significant for preparing samples from radioactive materials, studying complex structures that are orientation-dependent, and analyzing desired planar areas.

Keywords: X-750; in-plane liftout; in situ mechanical testing; transmission electron microscopy (TEM); focused ion beam (FIB); push-to-pull (PTP) (search for similar items in EconPapers)
JEL-codes: Q Q0 Q4 Q40 Q41 Q42 Q43 Q47 Q48 Q49 (search for similar items in EconPapers)
Date: 2024
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