Partial Discharge Inception Voltage Monitoring of Enameled Wires under Thermal Stress over Time

Ishtiaq Khan, Francesco Guastavino (), Laura Della Giovanna and Eugenia Torello
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Ishtiaq Khan: Department of Electrical, Electronics and Telecommunication Engineering and Naval Architecture (DITEN), University of Genova, 16145 Genova, Italy
Francesco Guastavino: Department of Electrical, Electronics and Telecommunication Engineering and Naval Architecture (DITEN), University of Genova, 16145 Genova, Italy
Laura Della Giovanna: Department of Electrical, Electronics and Telecommunication Engineering and Naval Architecture (DITEN), University of Genova, 16145 Genova, Italy
Eugenia Torello: Department of Electrical, Electronics and Telecommunication Engineering and Naval Architecture (DITEN), University of Genova, 16145 Genova, Italy

Energies, 2024, vol. 17, issue 18, 1-13

Abstract: Electrical insulation is a critical component in electrical machines. The performance of the insulation system can be adversely affected by operating conditions that induce aging. Assessing the impact of environmental stresses is essential for predicting the failure of electrical insulation. Predicting maintenance to prevent service interruptions caused by insulation breakdown is a key objective. For type I insulating systems used in low-voltage and low-power rotating electrical machines, it has been demonstrated that partial discharges (PDs) are a contributing factor to electrical insulation breakdown. In fact, these insulating systems are not able to withstand the action of PD activity. The inception and evolution of PD activity is an indication of the poor conditions of the electrical insulating system, and this activity can be produced by the electronic power supply. The progressive reduction in partial discharge inception voltage (PDIV) is attributed to the deterioration of insulation properties induced by operational stresses. This study aims to evaluate and compare the effects of thermal stress on various types of enameled wires by collecting the PDIV values over time. In this paper, the authors analyze some particular effects of thermal stress as an aging factor. During the tests, an electrical stress was applied, which acted as a conditioning stress rather than one capable of producing degradation phenomena, as it was not high enough to initiate PD activity. In this research study, twisted pairs prepared from copper wires were evaluated. These wires were coated with various types of enamel and belonged to the thermal class of 200 °C. The samples were subjected to thermal aging tests at different temperatures. An electrical conditioning stress was also applied during all the tests and pertained to the same voltage, amplitude and frequency. The PDIV value pertaining to each sample was regularly measured to monitor its evolution over time.

Keywords: electrical insulation; nano-filler enamel; partial discharge inception voltage; electrical aging (search for similar items in EconPapers)
JEL-codes: Q Q0 Q4 Q40 Q41 Q42 Q43 Q47 Q48 Q49 (search for similar items in EconPapers)
Date: 2024
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