High Impedance Fault Models for Overhead Distribution Networks: A Review and Comparison with MV Lab Experiments

Juan Carlos Huaquisaca Paye (), João Paulo A. Vieira, Jonathan Muñoz Tabora, André P. Leão, Murillo Augusto M. Cordeiro, Ghendy C. Junior, Adriano P. de Morais and Patrick E. Farias
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Juan Carlos Huaquisaca Paye: Institute of Technology, Electrical Engineering Faculty, Federal University of Pará, Belém 66075-110, Brazil
João Paulo A. Vieira: Institute of Technology, Electrical Engineering Faculty, Federal University of Pará, Belém 66075-110, Brazil
Jonathan Muñoz Tabora: Institute of Technology, Electrical Engineering Faculty, Federal University of Pará, Belém 66075-110, Brazil
André P. Leão: Institute of Technology, Electrical Engineering Faculty, Federal University of Pará, Belém 66075-110, Brazil
Murillo Augusto M. Cordeiro: Institute of Technology, Electrical Engineering Faculty, Federal University of Pará, Belém 66075-110, Brazil
Ghendy C. Junior: Department of Electrical Engineering, Federal University of Santa Maria, Santa Maria 97105-900, Brazil
Adriano P. de Morais: Department of Electrical Engineering, Federal University of Santa Maria, Santa Maria 97105-900, Brazil
Patrick E. Farias: Federal Institute of Education, Science and Technology, Federal Institute of Rio Grande do Sul, Farroupilhas 95174-274, Brazil

Energies, 2024, vol. 17, issue 5, 1-22

Abstract: Detecting and locating high impedance faults (HIF) in overhead distribution networks (ODN) remains one of the biggest challenges for manufacturers and researchers due to the complexity of this phenomenon, where the electrical current magnitude is similar to that of the loads. To simulate HIF, the selection of the HIF model is important, because it has to correctly reproduce the characteristics of this phenomenon, so that it does not negatively influence the simulations results. Therefore, HIF models play a fundamental role in proposing solutions and validating the effectiveness of the proposed methods to detect and localize HIF in ODN. This paper presents a systematic review of HIF models. It is intended to facilitate the selection of the HIF model to be considered. The models are validated based on experimental data from medium voltage (MV) laboratories, specifically, recorded waveforms from two HIF tests conducted in an MV lab were analyzed and compared with three established HIF models. The efficacy of these models was assessed against MV lab test data to ensure a precise representation of both transient and steady-state conditions for fault conductance and current waveforms. The findings show that the two nonlinear resistor models better approximate the waveforms obtained in the experimental tests performed in this study.

Keywords: high impedance faults (HIFs); HIF models; overhead distribution networks (ODN); lab experiment (search for similar items in EconPapers)
JEL-codes: Q Q0 Q4 Q40 Q41 Q42 Q43 Q47 Q48 Q49 (search for similar items in EconPapers)
Date: 2024
References: View complete reference list from CitEc
Citations: View citations in EconPapers (1)

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