Lifetime Behavior of Turn Insulation in Rotating Machines Under Repetitive Pulsed Stress

Ousama Zidane (), Rainer Haller, Pavel Trnka and Hans Bärnklau
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Ousama Zidane: Department of Power Engineering, Faculty of Electrical Engineering, University of West Bohemia, 301 00 Pilsen, Czech Republic
Rainer Haller: Department of Power Engineering, Faculty of Electrical Engineering, University of West Bohemia, 301 00 Pilsen, Czech Republic
Pavel Trnka: Department of Technologies and Measurement, Faculty of Electrical Engineering, University of West Bohemia, 301 00 Pilsen, Czech Republic
Hans Bärnklau: VEM Sachsenwerk, 01257 Dresden, Germany

Energies, 2025, vol. 18, issue 14, 1-18

Abstract: Insulation materials are critical for the reliability and performance of electrical power systems, particularly in high-voltage rotating machines. While failures can arise from thermal, mechanical, or electrical stress, they predominantly manifest as electrical breakdowns. Prior research has primarily concentrated on aging in straight winding sections, despite evidence indicating that failures frequently occur in the bending regions of turn insulation. This study explores the influence of high-frequency pulsed electrical stress on the lifetime behavior of Type II insulation systems used in high-voltage rotating machines. Practical samples, designed with geometric configurations and technology akin to that in rotating machines, were tested under conditions characterized by voltage slew rates (dv/dt) exceeding 10 kV/μs, with variations in frequency and waveform shape. The findings reveal that the rate of electrical aging remains consistent across differing pulse widths, risetimes, and polarities, displaying a similar lifetime exponent. Nonetheless, insulation durability is markedly more compromised under pulsed conditions. At the identical times-to-failure, the sinusoidal waveform necessitated nearly twice the applied peak voltage as the bipolar pulse waveform. This finding clearly suggests that pulsed excitation exacerbates insulation degradation more effectively due to the sharp rise times and high (dv/dt) rates imposing substantial electrical stress on dielectric materials.

Keywords: accelerated aging; turn insulation type II; lifetime behavior (search for similar items in EconPapers)
JEL-codes: Q Q0 Q4 Q40 Q41 Q42 Q43 Q47 Q48 Q49 (search for similar items in EconPapers)
Date: 2025
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