Computational Efficiency–Accuracy Trade-Offs in EMT Modeling of ANPC Converters: Comparative Study and Real-Time HIL Validation

Xinrong Yan, Zhijun Li, Jiajun Ding, Ping Zhang, Jia Huang, Qing Wei and Zhitong Yu ()
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Xinrong Yan: College of Energy Engineering, Zhejiang University, Hangzhou 310027, China
Zhijun Li: Huadian Electric Power Research Institute Co., Ltd., Hangzhou 310030, China
Jiajun Ding: Sichuan Energy Internet Research Institute, Tsinghua University, Chengdu 610213, China
Ping Zhang: Huadian Electric Power Research Institute Co., Ltd., Hangzhou 310030, China
Jia Huang: Huadian Electric Power Research Institute Co., Ltd., Hangzhou 310030, China
Qing Wei: Huadian Electric Power Research Institute Co., Ltd., Hangzhou 310030, China
Zhitong Yu: Department of Electrical Engineering, Tsinghua University, Beijing 100084, China

Energies, 2025, vol. 18, issue 19, 1-18

Abstract: With the increasing demands of the grid on power electronic converters, active neutral-point-clamped (ANPC) converters have been widely adopted due to their flexible modulation strategies and wide-range power regulation capabilities. To address grid-integration testing requirements for ANPC converters, this paper comparatively studies three electromagnetic transient (EMT) modeling approaches: switch-state prediction method (SPM), associated discrete circuit (ADC), and time-averaged method (TAM). Steady-state and transient simulations reveal that the SPM model achieves the highest accuracy (error ≤ 0.018%), while the TAM-based switching function model optimizes the efficiency–accuracy trade-off with 6.4× speedup versus traditional methods and acceptable error (≤2.62%). Consequently, the TAM model is implemented in a real-time hardware-in-the-loop (HIL) platform. Validation under symmetrical/asymmetrical grid faults confirms both the model’s efficacy and the controller’s robust fault ride-through capability.

Keywords: active neutral-point-clamped; electromagnetic transient simulation; associated discrete circuit; switching function model; time-averaged modeling; hardware-in-the-loop simulation (search for similar items in EconPapers)
JEL-codes: Q Q0 Q4 Q40 Q41 Q42 Q43 Q47 Q48 Q49 (search for similar items in EconPapers)
Date: 2025
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