Detection and Evaluation of Shield Damage Defects in Power Cables Using an Improved Dual-Frequency Time–Frequency Domain Reflectometry

Kun Zhao, Stefano Grivet-Talocia, Paolo Manfredi, Yuan Yan and Hongjie Li ()
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Kun Zhao: The State Key Laboratory of Insulation and Power Equipment, School of the Electrical Engineering, Xi’an Jiaotong University, Xi’an 710049, China
Stefano Grivet-Talocia: Department of Electronics and Telecommunications, Politecnico di Torino, 10129 Turin, Italy
Paolo Manfredi: Department of Electronics and Telecommunications, Politecnico di Torino, 10129 Turin, Italy
Yuan Yan: The State Key Laboratory of Insulation and Power Equipment, School of the Electrical Engineering, Xi’an Jiaotong University, Xi’an 710049, China
Hongjie Li: The State Key Laboratory of Insulation and Power Equipment, School of the Electrical Engineering, Xi’an Jiaotong University, Xi’an 710049, China

Energies, 2025, vol. 18, issue 19, 1-15

Abstract: Cable shields may develop holes when the sheath is damaged. Time–frequency domain reflectometry (TFDR) is an effective method for detecting cable defects, but it cannot directly evaluate hole sizes. To address this issue, we analyze the impact of shield hole sizes on TFDR signals. Building on this analysis, we propose an improved dual-frequency TFDR method to measure shield holes and evaluate their sizes. This method directly measures the characteristic impedances and damage ratios using dual-frequency TFDR, followed by a two-step evaluation process to determine the hole center angles and lengths based on these measurements. Simulations and experiments validate the proposed method. In laboratory-scale experiments using a scaled cable model, and considering measurement noise, the maximum relative errors for shield hole length and center angle are 11% and 5%, respectively.

Keywords: cable detection; defect location; cable damage; defect evaluation; time–frequency domain reflectometry (search for similar items in EconPapers)
JEL-codes: Q Q0 Q4 Q40 Q41 Q42 Q43 Q47 Q48 Q49 (search for similar items in EconPapers)
Date: 2025
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