Generalized Lissajous Trajectory Image Learning for Multi-Load Series Arc Fault Detection in 220 V AC Systems Considering PV and Battery Storage

Wenhai Zhang, Rui Tang, Junjian Wu, Yiwei Chen, Chunlan Yang and Shu Zhang ()
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Wenhai Zhang: College of Electrical Engineering, Sichuan University, Chengdu 610065, China
Rui Tang: College of Electrical Engineering, Sichuan University, Chengdu 610065, China
Junjian Wu: State Grid Wenzhou Electric Power Supply Company, Wenzhou 325000, China
Yiwei Chen: State Grid Wenzhou Electric Power Supply Company, Wenzhou 325000, China
Chunlan Yang: College of Electrical Engineering, Sichuan University, Chengdu 610065, China
Shu Zhang: College of Electrical Engineering, Sichuan University, Chengdu 610065, China

Energies, 2025, vol. 18, issue 22, 1-26

Abstract: This paper proposes a novel AC side series arc fault (SAF) identification method based on Generalized Lissajous Trajectory (GLT) learning for low-voltage residential circuits. The method addresses challenges in detecting SAFs—characterized by high concealment, random occurrence, and limitations in existing protection devices—by leveraging the Hilbert transform to map current signals into 2D Generalized Lissajous Trajectories. These trajectories amplify key SAF features (e.g., zero-break distortion and random pulses). A ResNet50-based image recognition model achieves high-precision fault detection under specific load types, with a validation accuracy of up to 99.91% for linear loads and 98.93% for nonlinear loads. The algorithm operates within 1.6 ms, enabling real-time circuit breaker tripping. The proposed method achieves higher recognition accuracy with lower computational cost compared to other image-based methods. In this paper, an adjustable load signal modeling approach is proposed to visualize the current signal using GLT and complete the lightweight identification based on ResNet network, which provides new ideas and methods for series arc fault detection.

Keywords: series arc fault; Lissajous Trajectory; arc fault detection device (AFDD); image recognition; low-voltage users (search for similar items in EconPapers)
JEL-codes: Q Q0 Q4 Q40 Q41 Q42 Q43 Q47 Q48 Q49 (search for similar items in EconPapers)
Date: 2025
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