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Modeling of the Electrical and Thermal Behaviors of an Ultracapacitor

Jeongbin Lee, Jaeshin Yi, Daeyong Kim, Chee Burm Shin, Kyung-Seok Min, Jongrak Choi and Ha-Young Lee
Additional contact information
Jeongbin Lee: Department of Energy Systems Research, Ajou University, Suwon 443-749, Korea
Jaeshin Yi: Department of Energy Systems Research, Ajou University, Suwon 443-749, Korea
Daeyong Kim: Department of Energy Systems Research, Ajou University, Suwon 443-749, Korea
Chee Burm Shin: Department of Energy Systems Research, Ajou University, Suwon 443-749, Korea
Kyung-Seok Min: Manufacturing Technology Center, LS Mtron Ltd., Gunpo 435-831, Korea
Jongrak Choi: Manufacturing Technology Center, LS Mtron Ltd., Gunpo 435-831, Korea
Ha-Young Lee: Ultracapacitor (UC) Team/R&D, LS Mtron Ltd., Anyang 431-831, Korea

Energies, 2014, vol. 7, issue 12, 1-15

Abstract: This paper reports a modeling methodology to predict the electrical and thermal behaviors of a 2.7 V/650 F ultracapacitor (UC) cell from LS Mtron Ltd. (Anyang, Korea). The UC cell is subject to the charge/discharge cycling with constant-current between 1.35 V and 2.7 V. The charge/discharge current values examined are 50, 100, 150, and 200 A. A three resistor-capacitor (RC) parallel branch model is employed to calculate the electrical behavior of the UC. The modeling results for the variations of the UC cell voltage as a function of time for various charge/discharge currents are in good agreement with the experimental measurements. A three-dimensional thermal model is presented to predict the thermal behavior of the UC. Both of the irreversible and reversible heat generations inside the UC cell are considered. The validation of the three-dimensional thermal model is provided through the comparison of the modeling results with the experimental infrared (IR) image at various charge/discharge currents. A zero-dimensional thermal model is proposed to reduce the significant computational burden required for the three-dimensional thermal model. The zero-dimensional thermal model appears to generate the numerical results accurate enough to resolve the thermal management issues related to the UC for automotive applications without relying on significant computing resources.

Keywords: ultracapacitor (UC); model; electrical behavior; thermal behavior (search for similar items in EconPapers)
JEL-codes: Q Q0 Q4 Q40 Q41 Q42 Q43 Q47 Q48 Q49 (search for similar items in EconPapers)
Date: 2014
References: View references in EconPapers View complete reference list from CitEc
Citations: View citations in EconPapers (2)

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