Technostress Dark Side of Technology in the Workplace: A Scientometric Analysis

Giorgia Bondanini, Gabriele Giorgi, Antonio Ariza-Montes, Alejandro Vega-Muñoz and Paola Andreucci-Annunziata
Additional contact information
Giorgia Bondanini: Department of Human Science, Università Europea di Roma, 00163 Roma, Italy
Gabriele Giorgi: Department of Human Science, Università Europea di Roma, 00163 Roma, Italy
Antonio Ariza-Montes: Social Matters Research Group, Universidad Loyola Andalucía, 14004 Córdoba, Spain
Alejandro Vega-Muñoz: Faculty of Business Administration, Universidad Autónoma de Chile, Santiago 7500912, Chile
Paola Andreucci-Annunziata: Faculty of Education, Pontificia Universidad Católica de Chile, Santiago 7820436, Chile

IJERPH, 2020, vol. 17, issue 21, 1-23

Abstract: This article aims to provide a critical review of the scientific research on technostress. As such, global references in this field are identified and highlighted in order to manage pre-existing knowledge and establish future ‘bridges’ among researchers, and to enhance the presently dispersed understanding of this subject. A scientometric meta-analysis of publications on technostress was conducted to achieve this objective. Mainstream journals from the Web of Science (WoS) were used to identify current topics, relevant journals, prolific authors, institutions, and countries, ‘schools of thought’ and the thematic areas around which current technostress debate revolves. In this article a significant contribution comes from the use of the scientific activity itself, together with scientometric meta-analysis techniques and the application of this scientific activity, its impact and relational character, to discover relevant countries, research organizations and authors which can constitute a global reference to demarcate this knowledge frontier, and who lead the ‘critical mass’ of global technostress researchers. This study also distinguishes between the relevant themes studied, with co-keywords plus bibliographic coupling citation, and examines the kind of stress the most prolific authors have considered and, therefore, to discover those topics which should be studied further to deepen this research field, in search of a post-disciplinary knowledge that allows unity of focus in technology and psychology.

Keywords: mental health; technostress; information-technology; dark side; work; information overload; scientometrics (search for similar items in EconPapers)
JEL-codes: I I1 I3 Q Q5 (search for similar items in EconPapers)
Date: 2020
References: View references in EconPapers View complete reference list from CitEc
Citations: View citations in EconPapers (18)

Downloads: (external link)
https://www.mdpi.com/1660-4601/17/21/8013/pdf (application/pdf)
https://www.mdpi.com/1660-4601/17/21/8013/ (text/html)

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:gam:jijerp:v:17:y:2020:i:21:p:8013-:d:437823

Access Statistics for this article

IJERPH is currently edited by Ms. Jenna Liu

More articles in IJERPH from MDPI
Bibliographic data for series maintained by MDPI Indexing Manager ().