Concurrent Control Chart Pattern Recognition: A Systematic Review

Ethel García, Rita Peñabaena-Niebles, Maria Jubiz-Diaz and Angie Perez-Tafur
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Ethel García: Department of Industrial Engineering, Universidad del Norte, Barranquilla 081007, Colombia
Rita Peñabaena-Niebles: Department of Industrial Engineering, Universidad del Norte, Barranquilla 081007, Colombia
Maria Jubiz-Diaz: Department of Industrial Engineering, Universidad del Norte, Barranquilla 081007, Colombia
Angie Perez-Tafur: Department of Industrial Engineering, Universidad del Norte, Barranquilla 081007, Colombia

Mathematics, 2022, vol. 10, issue 6, 1-31

Abstract: The application of statistical methods to monitor a process is critical to ensure its stability. Statistical process control aims to detect and identify abnormal patterns that disrupt the natural behaviour of a process. Most studies in the literature are focused on recognising single abnormal patterns. However, in many industrial processes, more than one unusual control chart pattern may appear simultaneously, i.e., concurrent control chart patterns (CCP). Therefore, this paper aims to present a classification framework based on categories to systematically organise and analyse the existing literature regarding concurrent CCP recognition to provide a concise summary of the developments performed so far and a helpful guide for future research. The search only included journal articles and proceedings in the area. The literature search was conducted using Web of Science and Scopus databases. As a result, 41 studies were considered for the proposed classification scheme. It consists of categories designed to assure an in-depth analysis of the most relevant topics in this research area. Results concluded a lack of research in this research field. The main findings include the use of machine learning methods; the study of non-normally distributed processes; and the consideration of abnormal patterns different from the shift, trend, and cycle behaviours.

Keywords: quality control; statistical process control; concurrent patterns; machine learning (search for similar items in EconPapers)
JEL-codes: C (search for similar items in EconPapers)
Date: 2022
References: View references in EconPapers View complete reference list from CitEc
Citations: View citations in EconPapers (3)

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