Damage Metrics for Void Detection in Adhesive Single-Lap Joints

António Francisco G. Tenreiro (), António M. Lopes () and Lucas F. M. da Silva
Additional contact information
António Francisco G. Tenreiro: Instituto de Ciência e Inovação em Engenharia Mecânica e Engenharia Industrial (INEGI), Campus da FEUP, R. Dr. Roberto Frias 400, 4200-465 Porto, Portugal
António M. Lopes: Instituto de Ciência e Inovação em Engenharia Mecânica e Engenharia Industrial (INEGI), Campus da FEUP, R. Dr. Roberto Frias 400, 4200-465 Porto, Portugal
Lucas F. M. da Silva: Instituto de Ciência e Inovação em Engenharia Mecânica e Engenharia Industrial (INEGI), Campus da FEUP, R. Dr. Roberto Frias 400, 4200-465 Porto, Portugal

Mathematics, 2023, vol. 11, issue 19, 1-43

Abstract: Structural Health Monitoring (SHM) techniques, such as Electromechanical Impedance Spectroscopy (EMIS), aim to continuously monitor structures for defects, thus avoiding the need for regular maintenance. While attention has been given to the application of EMIS in the automatic detection of damage in metallic and composite components, integrity monitoring of structural adhesive joints has been comparatively neglected. This paper investigated the use of damage metrics with electrical impedance measurements to detect defects in Single-Lap Joints (SLJs) bonded with a modified epoxy adhesive. Traditional metrics using statistical and distance-based concepts, such as the Root-Mean-Squared Deviation, R M S D , or the Correlation Coefficient, C C , are addressed at detecting voids in the adhesive layer and are applied to five different spectral frequency ranges. Furthermore, new damage metrics have been developed, such as the Average Canberra Distance, A C D , which enables a reduction of possible outliers in damage detection, or the complex Root-Mean-Squared Deviation, c R M S D , which allows for the use of both the real and imaginary components of the impedance, enabling better damage detection in structural adhesive joints. Overall, damage detection is achieved, and for certain spectral conditions, differentiation between certain damage sizes, using specific metrics, such as the R M S D or c R M S D , may be possible. Overall, the R M S D or c R M S D values from damaged SLJs tend to be double the metric values from undamaged joints.

Keywords: structural health monitoring; electromechanical impedance spectroscopy; adhesive joints; damage metrics; piezoelectric sensors; void (search for similar items in EconPapers)
JEL-codes: C (search for similar items in EconPapers)
Date: 2023
References: View complete reference list from CitEc
Citations:

Downloads: (external link)
https://www.mdpi.com/2227-7390/11/19/4127/pdf (application/pdf)
https://www.mdpi.com/2227-7390/11/19/4127/ (text/html)

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:gam:jmathe:v:11:y:2023:i:19:p:4127-:d:1251071

Access Statistics for this article

Mathematics is currently edited by Ms. Emma He

More articles in Mathematics from MDPI
Bibliographic data for series maintained by MDPI Indexing Manager ().