EconPapers    
Economics at your fingertips  
 

A Fault Detection System for Wiring Harness Manufacturing Using Artificial Intelligence

Jinwoo Song, Prashant Kumar, Yonghawn Kim and Heung Soo Kim ()
Additional contact information
Jinwoo Song: Department of Mechanical, Robotics and Energy Engineering, Dongguk University-Seoul, Seoul 04620, Republic of Korea
Prashant Kumar: Department of Mechanical, Robotics and Energy Engineering, Dongguk University-Seoul, Seoul 04620, Republic of Korea
Yonghawn Kim: R&D Center, SUNG CHANG Co., Busan 46707, Republic of Korea
Heung Soo Kim: Department of Mechanical, Robotics and Energy Engineering, Dongguk University-Seoul, Seoul 04620, Republic of Korea

Mathematics, 2024, vol. 12, issue 4, 1-17

Abstract: Due to its simplicity, accuracy, and adaptability, Crimp Force Monitoring (CFM) has long been the standard for fault detection in wiring harness manufacturing. However, it necessitates frequent reconfigurations based on the variability in materials, dependency on operator skill, and high costs of implementation, and thus reconfiguration presents significant challenges. To solve these problems, this paper introduces a fault detection system that employs an Artificial Intelligence (AI) classification model to enhance the performance and cost-efficiency of the quality control process of wiring harness manufacturing. Since there are no labeled data to train the classification model at the onset of manufacturing, a small number of normal data from each production run are manually extracted to train the model. To address the constraint of the limited available data, the system generates synthetic data from normal data, simulating potential defects by using Regional Selective Data Scaling (RSDS). This innovative method performs upscaling or downscaling on specific regions of the original data to produce synthetic abnormal data, which enables the fault detection system to efficiently train its classification model with a dataset consisting solely of normal operation data.

Keywords: Artificial Intelligence; anomaly detection; synthetic data; data augmentation; wiring harness; manufacturing system (search for similar items in EconPapers)
JEL-codes: C (search for similar items in EconPapers)
Date: 2024
References: View references in EconPapers View complete reference list from CitEc
Citations:

Downloads: (external link)
https://www.mdpi.com/2227-7390/12/4/537/pdf (application/pdf)
https://www.mdpi.com/2227-7390/12/4/537/ (text/html)

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:gam:jmathe:v:12:y:2024:i:4:p:537-:d:1336205

Access Statistics for this article

Mathematics is currently edited by Ms. Emma He

More articles in Mathematics from MDPI
Bibliographic data for series maintained by MDPI Indexing Manager ().

 
Page updated 2025-03-19
Handle: RePEc:gam:jmathe:v:12:y:2024:i:4:p:537-:d:1336205