A Novel Methodology for Performance Evaluation in Advanced Quality Control

Ethel García, Rita Peñabaena-Niebles (), Winston S. Percybrooks and Kevin Palomino
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Ethel García: Department of Industrial Engineering, Universidad del Norte, Barranquilla 081007, Colombia
Rita Peñabaena-Niebles: Department of Industrial Engineering, Universidad del Norte, Barranquilla 081007, Colombia
Winston S. Percybrooks: Department of Industrial Engineering, Universidad del Norte, Barranquilla 081007, Colombia
Kevin Palomino: Department of Industrial Engineering, Universidad del Norte, Barranquilla 081007, Colombia

Mathematics, 2025, vol. 13, issue 2, 1-20

Abstract: Current global conditions and challenges in industrial manufacturing, marked by dynamism, competition, and the need for responsible resource management, have increased the demand for sustainable manufacturing practices. The integration of Industry 4.0 and the recent development of Industry 5.0 have added dynamism, which has generated profound implications for quality control and process monitoring, focusing mainly on recognising control patterns within the manufacturing environment. This study introduces a novel methodology for evaluating the performance of pattern classification models used in advanced quality control. Our approach incorporates robust performance metrics, early detection, window size, network hyperparameters, and concurrent patterns within a simulated monitoring environment. Unlike previous research, our evaluation methodology addresses the sensitivity of classification models to various factors, emphasising the critical balance between early detection and minimising false alarms. The findings reveal that window size significantly impacts the model’s sensitivity to pattern changes, highlighting that measuring early detection alone is impractical in real-world applications. Furthermore, optimal hyperparameter selection enhances the model’s practical applicability.

Keywords: control chart pattern recognition; concurrent pattern; window size; long short term memory (search for similar items in EconPapers)
JEL-codes: C (search for similar items in EconPapers)
Date: 2025
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