Accelerated Life Tests under Pareto-IV Lifetime Distribution: Real Data Application and Simulation Study

A. M. Abd El-Raheem, M. H. Abu-Moussa, Marwa M. Mohie El-Din and E. H. Hafez
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A. M. Abd El-Raheem: Department of Mathematics, Faculty of Education, Ain Shams University, Cairo 11566, Egypt
M. H. Abu-Moussa: Department of Mathematics, Faculty of Science, Cairo University, Giza 12511, Egypt
Marwa M. Mohie El-Din: Department of Mathematics, Faculty of Engineering, Egyptian Russian University, Cairo 11829, Egypt
E. H. Hafez: Department of Mathematics, Faculty of Science, Helwan University, Cairo 11795, Egypt

Mathematics, 2020, vol. 8, issue 10, 1-19

Abstract: In this article, a progressive-stress accelerated life test (ALT) that is based on progressive type-II censoring is studied. The cumulative exposure model is used when the lifetime of test units follows Pareto-IV distribution. Different estimates as the maximum likelihood estimates (MLEs) and Bayes estimates (BEs) for the model parameters are discussed. Bayesian estimates are derived while using the Tierney and Kadane (TK) approximation method and the importance sampling method. The asymptotic and bootstrap confidence intervals (CIs) of the parameters are constructed. A real data set is analyzed in order to clarify the methods proposed through this paper. Two types of the progressive-stress tests, the simple ramp-stress test and multiple ramp-stress test, are compared through the simulation study. Finally, some interesting conclusions are drawn.

Keywords: progressive-stress; progressive type-II censoring; maximum likelihood estimation; bayes estimation; Tierney and Kadane approximation; simulation study (search for similar items in EconPapers)
JEL-codes: C (search for similar items in EconPapers)
Date: 2020
References: View references in EconPapers View complete reference list from CitEc
Citations: View citations in EconPapers (1)

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