A Rectifying Acceptance Sampling Plan Based on the Process Capability Index
Ching-Ho Yen,
Chun-Chia Lee,
Kuo-Hung Lo,
Yeou-Ren Shiue and
Shu-Hua Li
Additional contact information
Ching-Ho Yen: Department of Industrial Engineering & Management Information, Huafan University, New Taipei City 223, Taiwan
Chun-Chia Lee: School of Business, Minnan Normal University, Zhangzhou 363000, China
Kuo-Hung Lo: Department of Economic & Statistics, Fujian Business University, Fuzhou 350016, China
Yeou-Ren Shiue: Department of Management Engineering, Fujian Business University, Fuzhou 350016, China
Shu-Hua Li: Graduate Institute of Technology, Innovation and Intellectual Property Management, College of Commerce, National Cheng-chi University, Taipei City 116, Taiwan
Mathematics, 2020, vol. 8, issue 1, 1-12
Abstract:
The acceptance sampling plan and process capability index (PCI) are critical decision tools for quality control. Recently, numerous research papers have examined the acceptance sampling plan in combination with the PCI. However, most of these papers have not considered the aspect of rectifying inspections. In this paper, we propose a quality cost model of repetitive sampling to develop a rectifying acceptance sampling plan based on the one-sided PCI. This proposed model minimizes the total quality cost (TQC) of sentencing one lot, including inspection cost, internal failure cost, and external failure cost. In addition, sensitivity analysis is conducted to investigate the behavior of relevant parameters against TQC. To demonstrate the advantages of the proposed methodology, a comparison is implemented with the existing rectifying sampling plan in terms of TQC and average outgoing quality limit. This comparison reveals that our proposed methodology exhibits superior performance.
Keywords: acceptance sampling plan; process capability indices; rectifying inspection; average outgoing quality limit; sensitivity analysis (search for similar items in EconPapers)
JEL-codes: C (search for similar items in EconPapers)
Date: 2020
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Citations: View citations in EconPapers (1)
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