Statistical RF/Analog Integrated Circuit Design Using Combinatorial Randomness for Hardware Security Applications

Ethan Chen and Vanessa Chen
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Ethan Chen: Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, PA 15213, USA
Vanessa Chen: Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, PA 15213, USA

Mathematics, 2020, vol. 8, issue 5, 1-18

Abstract: While integrated circuit technologies keep scaling aggressively, analog, mixed-signal, and radio-frequency (RF) circuits encounter challenges by creating robust designs in advanced complementary metal–oxide–semiconductor (CMOS) processes with the diminishing voltage headroom. The increasing random mismatch of smaller feature sizes in leading-edge technology nodes severely limit the benefits of scaling for (RF)/analog circuits. This paper describes the details of the combinatorial randomness by statistically selecting device elements that relies on the significant growth in subsets number of combinations. The randomness can be utilized to provide post-manufacturing reconfiguration of the selectable circuit elements to achieve required specifications for ultra-low-power systems. The calibration methodology is demonstrated with an ultra-low-voltage chaos-based true random number generator (TRNG) for energy-constrained Internet of things (IoT) devices in the secure communications.

Keywords: statistical element selection; combinatorial randomness; statistical RF/analog circuit design; hardware security; secure communication; true random number generator (search for similar items in EconPapers)
JEL-codes: C (search for similar items in EconPapers)
Date: 2020
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