An Improved Soft Island Model of the Fish School Search Algorithm with Exponential Step Decay Using Cluster-Based Population Initialization
Liliya A. Demidova () and
Vladimir E. Zhuravlev ()
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Liliya A. Demidova: Institute for Information Technologies, Federal State Budget Educational Institution of Higher Education, MIREA—Russian Technological University, 78, Vernadsky Avenue, 119454 Moscow, Russia
Vladimir E. Zhuravlev: Institute for Information Technologies, Federal State Budget Educational Institution of Higher Education, MIREA—Russian Technological University, 78, Vernadsky Avenue, 119454 Moscow, Russia
Stats, 2025, vol. 8, issue 1, 1-35
Abstract:
Optimization is a highly relevant area of research due to its widespread applications. The development of new optimization algorithms or the improvement of existing ones enhances the efficiency of various fields of activity. In this paper, an improved Soft Island Model (SIM) is considered for the Tent-map-based Fish School Search algorithm with Exponential step decay (ETFSS). The proposed model is based on a probabilistic approach to realize the migration process relying on the statistics of the overall achievement of each island. In order to generate the initial population of the algorithm, a new initialization method is proposed in which all islands are formed in separate regions of the search space, thus forming clusters. For the presented SIM-ETFSS algorithm, numerical experiments with the optimization of classical test functions, as well as checks for the presence of some known defects that lead to undesirable effects in problem solving, have been carried out. Tools, such as the Mann–Whitney U test, box plots and other statistical methods of data analysis, are used to evaluate the quality of the presented algorithm, using which the superiority of SIM-ETFSS over its original version is demonstrated. The results obtained are analyzed and discussed.
Keywords: evolutionary optimization; swarm intelligence; Fish School Search; Soft Island Model; center-bias operator; unevenness defect; Mann–Whitney U test (search for similar items in EconPapers)
JEL-codes: C1 C10 C11 C14 C15 C16 (search for similar items in EconPapers)
Date: 2025
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