Genetics of Resistance to Leaf Rust in Wheat: An Overview in a Genome-Wide Level

Xiaopeng Ren, Chuyuan Wang, Zhuang Ren, Jing Wang, Peipei Zhang, Shuqing Zhao, Mengyu Li, Meng Yuan, Xiumei Yu, Zaifeng Li, Shisheng Chen () and Xiaodong Wang ()
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Xiaopeng Ren: State Key Laboratory of North China Crop Improvement and Regulation, College of Plant Protection, Hebei Agricultural University, Baoding 071000, China
Chuyuan Wang: State Key Laboratory of North China Crop Improvement and Regulation, College of Plant Protection, Hebei Agricultural University, Baoding 071000, China
Zhuang Ren: State Key Laboratory of North China Crop Improvement and Regulation, College of Plant Protection, Hebei Agricultural University, Baoding 071000, China
Jing Wang: College of Civil Engineering and Architecture, Hebei University, Baoding 071000, China
Peipei Zhang: State Key Laboratory of North China Crop Improvement and Regulation, College of Plant Protection, Hebei Agricultural University, Baoding 071000, China
Shuqing Zhao: State Key Laboratory of North China Crop Improvement and Regulation, College of Plant Protection, Hebei Agricultural University, Baoding 071000, China
Mengyu Li: State Key Laboratory of North China Crop Improvement and Regulation, College of Plant Protection, Hebei Agricultural University, Baoding 071000, China
Meng Yuan: State Key Laboratory of North China Crop Improvement and Regulation, College of Plant Protection, Hebei Agricultural University, Baoding 071000, China
Xiumei Yu: College of Life Science, Hebei Agricultural University, Baoding 071000, China
Zaifeng Li: State Key Laboratory of North China Crop Improvement and Regulation, College of Plant Protection, Hebei Agricultural University, Baoding 071000, China
Shisheng Chen: Peking University Institute of Advanced Agricultural Sciences, Weifang 261000, China
Xiaodong Wang: State Key Laboratory of North China Crop Improvement and Regulation, College of Plant Protection, Hebei Agricultural University, Baoding 071000, China

Sustainability, 2023, vol. 15, issue 4, 1-27

Abstract: Due to the global warming and dynamic changes in pathogenic virulence, leaf rust caused by Puccinia triticina has greatly expanded its epidermic region and become a severe threat to global wheat production. Genetic bases of wheat resistance to leaf rust mainly rely on the leaf rust resistance ( Lr ) gene or quantitative trait locus ( QLr ). Although these genetic loci have been insensitively studied during the last two decades, an updated overview of Lr/QLr in a genome-wide level is urgently needed. This review summarized recent progresses of genetic studies of wheat resistance to leaf rust. Wheat germplasms with great potentials for genetic improvement in resistance to leaf rust were highlighted. Key information about the genetic loci carrying Lr/QLr was summarized. A genome-wide chromosome distribution map for all of the Lr/QLr was generated based on the released wheat reference genome. In conclusion, this review has provided valuable sources for both wheat breeders and researchers to understand the genetics of resistance to leaf rust in wheat.

Keywords: Puccinia triticina; Lr genes; genetic loci; resistant germplasms; chromosome distribution (search for similar items in EconPapers)
JEL-codes: O13 Q Q0 Q2 Q3 Q5 Q56 (search for similar items in EconPapers)
Date: 2023
References: View complete reference list from CitEc
Citations: View citations in EconPapers (1)

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