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Reliability Assessment for Very Few Failure Data and Weibull Distribution

Lulu Zhang, Guang Jin and Yang You

Mathematical Problems in Engineering, 2019, vol. 2019, 1-9

Abstract:

Only very few failure data can be obtained for the time censored test of high-reliability and long-life products. For very few failure data, the current methods fail to obtain both the point estimation and confidence interval of reliability parameters. If the point estimation and confidence interval of reliability parameters are obtained based on different methods, the results tend to be unreliable. In this study, based on the existing research, a Bayesian reliability evaluation method for very few failure data under the Weibull distribution was proposed. First, the range of failure probability was limited based on the convexity and self-features of the Weibull distribution function. Second, based on the background of the sample with very few failure data, the pretest distribution function and parameters were set and solved. The point estimation and confidence interval model of failure probability based on the Bayesian formula was established. The improved match distribution curve method was used to compute both the point estimation and confidence interval of reliability parameters. Furthermore, by comparing the results of numerical examples, the calculation results obtained by the proposed method were verified as being very reasonable. Finally, taking wet friction plates as an example, the results showed the effectiveness of this method in engineering practice.

Date: 2019
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Citations: View citations in EconPapers (3)

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Persistent link: https://EconPapers.repec.org/RePEc:hin:jnlmpe:8947905

DOI: 10.1155/2019/8947905

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