A New Software Reliability Growth Model: Multigeneration Faults and a Power-Law Testing-Effort Function

Fan Li and Ze-Long Yi

Mathematical Problems in Engineering, 2016, vol. 2016, 1-13

Abstract:

Software reliability growth models (SRGMs) based on a nonhomogeneous Poisson process (NHPP) are widely used to describe the stochastic failure behavior and assess the reliability of software systems. For these models, the testing-effort effect and the fault interdependency play significant roles. Considering a power-law function of testing effort and the interdependency of multigeneration faults, we propose a modified SRGM to reconsider the reliability of open source software (OSS) systems and then to validate the model’s performance using several real-world data. Our empirical experiments show that the model well fits the failure data and presents a high-level prediction capability. We also formally examine the optimal policy of software release, considering both the testing cost and the reliability requirement. By conducting sensitivity analysis, we find that if the testing-effort effect or the fault interdependency was ignored, the best time to release software would be seriously delayed and more resources would be misplaced in testing the software.

Date: 2016
References: Add references at CitEc
Citations:

Downloads: (external link)
http://downloads.hindawi.com/journals/MPE/2016/9276093.pdf (application/pdf)
http://downloads.hindawi.com/journals/MPE/2016/9276093.xml (text/xml)

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:hin:jnlmpe:9276093

DOI: 10.1155/2016/9276093

Access Statistics for this article

More articles in Mathematical Problems in Engineering from Hindawi
Bibliographic data for series maintained by Mohamed Abdelhakeem ().