Chi-squared control chart for multiple attributes

Salah Haridy, Zhang Wu and John Flaig

International Journal of Industrial and Systems Engineering, 2012, vol. 12, issue 3, 316-330

Abstract: In recent years, attribute control charts have been increasingly adopted in manufacturing processes and service sectors for monitoring the quality characteristics that cannot be numerically measured. The multiattribute control charts have been proved to be more effective than the simultaneous multiple individual charts for monitoring multiattribute processes. In this paper, a new multiattribute chi-squared (Χ²) chart is proposed to monitor the processes in which more than one type of defects exist on the non-conforming item. Some practical examples are given to illustrate the effectiveness of the new chart in monitoring the multiattribute processes compared with that of the individual p charts and other multiattribute charts.

Keywords: SPC; statistical process control; control charts; chi-squared charts; overall p charts; multiattribute charts; process monitoring. (search for similar items in EconPapers)
Date: 2012
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