Double acceptance sampling plan based on the Burr type X distribution under truncated life tests

Wenhao Gui and Xinman Lu

International Journal of Industrial and Systems Engineering, 2018, vol. 28, issue 3, 319-330

Abstract: In this paper, we propose a double acceptance sampling plan for the Burr type X distribution when the lifetime experiment is truncated at a predetermined time. Considering the zero and one failure scheme, the minimum sample sizes of the first and second samples necessary to ensure the specified median life are obtained at the given consumer's confidence level. The operating characteristic values are analysed with various ratios of the true median lifetime to the specified life of the product. The minimum ratios of the median life to the specified life are also presented. We illustrate the double acceptance sampling plan with a numerical example.

Keywords: double acceptance sampling plan; producer's risk; truncated life test; Burr type X distribution; operating characteristic function value. (search for similar items in EconPapers)
Date: 2018
References: Add references at CitEc
Citations:

Downloads: (external link)
http://www.inderscience.com/link.php?id=89742 (text/html)
Access to full text is restricted to subscribers.

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:ids:ijisen:v:28:y:2018:i:3:p:319-330

Access Statistics for this article

More articles in International Journal of Industrial and Systems Engineering from Inderscience Enterprises Ltd
Bibliographic data for series maintained by Sarah Parker ().