Designing of single acceptance sampling plan based on time truncated life test under new Weibull-Pareto distribution

S. Swathi Sundari, G. Kannan, S. Balamurali, K. Lakshmanan and G. Selvaraj

International Journal of Mathematics in Operational Research, 2026, vol. 33, issue 4, 489-500

Abstract: This article focuses on designing a single acceptance sampling plan (SASP) that guarantees the percentile lifetime (lifespan) of a product follows a new Weibull-Pareto distribution (NWPD) on the basis of a time-truncated life test (TTL) with a known shape parameter. Considering both producer's risk (α) and consumer's risk (β), a two-point technique to the operating characteristic (OC) curve is applied in this study to find the most appropriate suitable plan parameters like sample size (n) and acceptance number (c). Our aim is to simultaneously satisfy the expectations of both producers and consumers. To select the most appropriate plan parameters, we generate tables representing various percentile values of the NWPD.

Keywords: new Weibull-Pareto distribution; NWPD; percentile life; single acceptance sampling plan; SASP; time truncated life test; TTL test. (search for similar items in EconPapers)
Date: 2026
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