A strategy for improvement of the C pk of DRAM modules in the depanel process of PCBA

Zone-Ching Lin and Chih-Yuan Ho

International Journal of Manufacturing Technology and Management, 2007, vol. 10, issue 2/3, 310-322

Abstract: This paper is to improve the dimensional accuracy of Small Outline Dual Inline Memory Modules (SO-DIMMs), which is a kind of Dynamic Random Access Memory (DRAM) modules for notebook computer, in the depanel process. This study proposes the implementation of combining grey relation analysis with Statistical Process Control (SPC) analysis, so as to quickly search the result that progressive tool wear is the dominant parameters adversely influencing the accuracy in the depanel process. To resolve tool wear issue, this paper implements the pretreated milling for a certain working distance before practically proceeding the depanel process. The accuracy of products, therefore, appears to be feasibly controllable. Furthermore, this study adopts SPC analysis to evaluate the improvement effect, revealing that C_pk value dramatically increases from 0.788 to 2.175, and the tool life of mill can also be extended from milling of 25 to 45 panels. It has also been successfully implemented in an international factory, resulting in a yield of more than 1 million DRAM modules.

Keywords: depanel process; tool wear; small outline dual inline memory module; SO-DIMM; grey relation analysis; tool life; statistical process control; SPC; DRAM modules; notebook computers; C pk value; milling; manufacturing; process capability; printed circuit boards; PCB assembly. (search for similar items in EconPapers)
Date: 2007
References: Add references at CitEc
Citations:

Downloads: (external link)
http://www.inderscience.com/link.php?id=11856 (text/html)
Access to full text is restricted to subscribers.

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:ids:ijmtma:v:10:y:2007:i:2/3:p:310-322

Access Statistics for this article

More articles in International Journal of Manufacturing Technology and Management from Inderscience Enterprises Ltd
Bibliographic data for series maintained by Sarah Parker ().