 Yield management in TFT-LCD manufacturing by using regression and neural network techniquesKun-Lin Hsieh International Journal of Manufacturing Technology and Management, 2010, vol. 20, issue 1/2/3/4, 300-315 Abstract: Enhancing yield became an important competitive capability for thin film transistor-liquid crystal displays (TFT-LCD) manufacturers. Until now, few studies were proposed to address the related issues about the yield model via process analysis in TFT-LCD industry. Therefore, the useful information (e.g., the domain knowledge or the parameter effect) or the improvement chances which are hidden in process analysis will be frequently omitted. Hence, how to apply feasible technique into achieving the yield optimisation model by using the manufacturing processes will become a meaningful issue to be addressed in TFT-LCD industry. In this study, we proposed a feasible procedure, which incorporating the conventionally statistical technique and the artificial intelligence (AI), to achieve the construction of the yield optimisation model. Besides, a real illustrative case owing to TFT-LCD manufacturer at Tainan Science Park in Taiwan will be also applied to verify the rationality and feasibility of our proposed procedure. Keywords: process analysis; thin film transistors; liquid crystal displays; TFT-LCD; backpropagation neural networks; BPNN; stepwise regression; yield models; Taiwan. (search for similar items in EconPapers) Downloads: (external link) Related works: Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text Persistent link: https://EconPapers.repec.org/RePEc:ids:ijmtma:v:20:y:2010:i:1/2/3/4:p:300-315 Access Statistics for this article More articles in International Journal of Manufacturing Technology and Management from Inderscience Enterprises Ltd |
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