Design of a self-assessment model for evaluating corporate-wide learning performance in manufacturing enterprises
K.F. Pun,
W.G. Lewis and
K.S. Chin
International Journal of Manufacturing Technology and Management, 2003, vol. 5, issue 5/6, 428-442
Abstract:
While facing competitions in today's dynamic global markets, manufacturers have realised the need for corporate-wide learning performance to gain a competitive advantage. This paper discusses the concepts and determinants for a learning organisation (LO), and presents a generic self-assessment model for manufacturers to evaluate their corporate-wide learning performance. Eight evaluation criteria and 21 sub-criteria have been identified. Personal interviews with industry experts and practitioners were conducted to validate the relative importance of these criteria and sub-criteria using the analytical hierarchy process (AHP) techniques. Key empirical findings were incorporated to develop a self-assessment scoring mechanism for the model. The model can provide manufacturers with a feasible reference to help develop their own self-assessment system and monitor learning performance.
Keywords: learning organisation; analytical hierarchy process; self-assessment model; performance evaluation. (search for similar items in EconPapers)
Date: 2003
References: Add references at CitEc
Citations:
Downloads: (external link)
http://www.inderscience.com/link.php?id=3701 (text/html)
Access to full text is restricted to subscribers.
Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.
Export reference: BibTeX
RIS (EndNote, ProCite, RefMan)
HTML/Text
Persistent link: https://EconPapers.repec.org/RePEc:ids:ijmtma:v:5:y:2003:i:5/6:p:428-442
Access Statistics for this article
More articles in International Journal of Manufacturing Technology and Management from Inderscience Enterprises Ltd
Bibliographic data for series maintained by Sarah Parker ().