Fabrication of pin diodes using direct-bonded silicon wafers
Iqbal K. Bansal and
Mark Surgent
International Journal of Manufacturing Technology and Management, 2005, vol. 7, issue 5/6, 553-565
Abstract:
Direct wafer bonding is an operation of ultra-fine alignment, joining and thermal bonding of two silicon wafers. The silicon wafers are chemically cleaned in order to minimise surface contamination. The wafer surface is either 'hydrophilic' or 'hydrophobic'. The 'hydrophobic' surface is achieved using an in-situ oxide etching process. The joining step is performed in a Class 100 or better environment by employing a semi-automatic joiner. Then, thermal bonding operation is carried out at elevated temperatures. Detailed product yield data are presented. The application of silicon-direct wafer bonded substrates provides a quantum jump in the device electrical performance of PIN diodes.
Keywords: direct wafer bonding; hydrophilic; hydrophobic; light point defects; voids; pin diodes; silicon wafers; semiconductor manufacturing; oxide etching; joining; thermal bonding; ultra-fine alignment; electrical performance; MEMS; microelectromechanical systems. (search for similar items in EconPapers)
Date: 2005
References: Add references at CitEc
Citations:
Downloads: (external link)
http://www.inderscience.com/link.php?id=7703 (text/html)
Access to full text is restricted to subscribers.
Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.
Export reference: BibTeX
RIS (EndNote, ProCite, RefMan)
HTML/Text
Persistent link: https://EconPapers.repec.org/RePEc:ids:ijmtma:v:7:y:2005:i:5/6:p:553-565
Access Statistics for this article
More articles in International Journal of Manufacturing Technology and Management from Inderscience Enterprises Ltd
Bibliographic data for series maintained by Sarah Parker ().