A fractal dimension-based method for statistical process control

Vijay Shah and David E. Booth

International Journal of Operational Research, 2012, vol. 14, issue 2, 187-199

Abstract: For the development of computer-based statistical process control, it would be useful to have an algorithm that performs the work of a Shewhart control chart without actually having to construct such a chart. In this paper, we test the use of fractal dimension, an algorithm to track 'out of control' states and find it to be moderately successful.

Keywords: fractal dimension; outliers; statistical process control; SPC; control charts. (search for similar items in EconPapers)
Date: 2012
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