Graph-Based Modelling of Concurrent Sequential Patterns

Jing Lu, Weiru Chen and Malcolm Keech
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Jing Lu: Southampton Solent University, UK
Weiru Chen: Shenyang Institute of Chemical Technology, China
Malcolm Keech: University of Bedfordshire, UK

International Journal of Data Warehousing and Mining (IJDWM), 2010, vol. 6, issue 2, 41-58

Abstract: Structural relation patterns have been introduced recently to extend the search for complex patterns often hidden behind large sequences of data. This has motivated a novel approach to sequential patterns post-processing and a corresponding data mining method was proposed for Concurrent Sequential Patterns (ConSP). This article refines the approach in the context of ConSP modelling, where a companion graph-based model is devised as an extension of previous work. Two new modelling methods are presented here together with a construction algorithm, to complete the transformation of concurrent sequential patterns to a ConSP-Graph representation. Customer orders data is used to demonstrate the effectiveness of ConSP mining while synthetic sample data highlights the strength of the modelling technique, illuminating the theories developed.

Date: 2010
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