Detection and Recognition of RF Devices Using Support Vector Machine

Shikhar P. Acharya and Ivan G. Guardiola
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Shikhar P. Acharya: Missouri University of Science and Technology, Rolla, MO, USA
Ivan G. Guardiola: Missouri University of Science and Technology, Rolla, MO, USA

International Journal of Interdisciplinary Telecommunications and Networking (IJITN), 2013, vol. 5, issue 4, 13-20

Abstract: Radio Frequency (RF) devices produce some amount of Unintended Electromagnetic Emissions (UEEs). UEEs are generally unique to a device and can be used as a signature for the purpose of detection and identification. The problem with UEEs is that they are very low in power and are often buried deep inside the noise band. The research herein provides the application of Support Vector Machine (SVM) for detection and identification of RF devices using their UEEs. Experimental Results shows that SVM can detect RF devices within the noise band, and can also identify RF devices using their UEEs.

Date: 2013
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Persistent link: https://EconPapers.repec.org/RePEc:igg:jitn00:v:5:y:2013:i:4:p:13-20

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