Learning and fatigue during choice experiments: a comparison of online and mail survey modes

Scott Savage () and Donald Waldman ()

Journal of Applied Econometrics, 2008, vol. 23, issue 3, 351-371

Abstract: This study investigates the effect of survey mode on respondent learning and fatigue during repeated choice experiments. Stated preference data are obtained from an experiment concerning high-speed Internet service conducted on samples of mail respondents and online respondents. We identify and estimate aspects of the error components for different subsets of the choice questions, for both mail and online respondents. Results show mail respondents answer questions consistently throughout a series of choice experiments, but the quality of the online respondents' answers declines. Therefore, while the online survey provides lower survey administration costs and reduced time between implementation and data analysis, such benefits come at the cost of less precise responses. Copyright © 2008 John Wiley & Sons, Ltd.

Date: 2008
References: View references in EconPapers View complete reference list from CitEc
Citations: View citations in EconPapers (77)

Downloads: (external link)
http://hdl.handle.net/10.1002/jae.984 Link to full text; subscription required (text/html)
http://qed.econ.queensu.ca:80/jae/2008-v23.3/ Supporting data files and programs (text/html)

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:jae:japmet:v:23:y:2008:i:3:p:351-371

Ordering information: This journal article can be ordered from
http://www3.intersci ... e.jsp?issn=0883-7252

DOI: 10.1002/jae.984

Access Statistics for this article

Journal of Applied Econometrics is currently edited by M. Hashem Pesaran

More articles in Journal of Applied Econometrics from John Wiley & Sons, Ltd.
Bibliographic data for series maintained by Wiley-Blackwell Digital Licensing () and Christopher F. Baum ().