Estimating and forecasting the long-memory parameter in the presence of periodicity

Cleber Bisognin and S. R. C. Lopes
Additional contact information
S. R. C. Lopes: Instituto de Matemática-UFRGS, Porto Alegre, Brazil, Postal: Instituto de Matemática-UFRGS, Porto Alegre, Brazil

Journal of Forecasting, 2007, vol. 26, issue 6, 405-427

Abstract: We consider one parametric and five semiparametric approaches to estimate D in SARFIMA (0, D, 0) s processes, that is, when the process is a fractionally integrated ARMA model with seasonality s. We also consider h-step-ahead forecasting for these processes. We present the proof of some features of this model and also a study based on a Monte Carlo simulation for different sample sizes and different seasonal periods. We compare the different estimation procedures analyzing the bias, the mean squared error values, and the confidence intervals for the estimators. We also consider three different methods to choose the total number of regressors in the regression analysis for the semiparametric class of estimation procedures. We apply the methodology to the Nile River flow monthly data, and also to a simulated seasonal fractionally integrated time series. Copyright © 2007 John Wiley & Sons, Ltd.

Date: 2007
References: View references in EconPapers View complete reference list from CitEc
Citations: View citations in EconPapers (1)

Downloads: (external link)
http://hdl.handle.net/10.1002/for.1030 Link to full text; subscription required (text/html)

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:jof:jforec:v:26:y:2007:i:6:p:405-427

DOI: 10.1002/for.1030

Access Statistics for this article

Journal of Forecasting is currently edited by Derek W. Bunn

More articles in Journal of Forecasting from John Wiley & Sons, Ltd.
Bibliographic data for series maintained by Wiley-Blackwell Digital Licensing () and Christopher F. Baum ().