Returns to Scale on Nonparametric Deterministic Technologies: Simplifying Goodness-of-Fit Methods Using Operations on Technologies

Walter Briec, Kristiaan Kerstens, Hervé Leleu and Philippe Eeckaut

Journal of Productivity Analysis, 2000, vol. 14, issue 3, 267-274

Abstract: Thepurpose of this short article is to simplify goodness-of-fitmethods to obtain qualitative information about returns to scalefor individual observations. Traditional and new goodness-of-fitmethods developed for estimating returns to scale on nonparametricdeterministic reference technologies are reviewed. Using compositionrules for technologies with specific returns to scale assumptions,we show how these goodness-of-fit methods can be simplified inthe case of convex technologies (Data Envelopment Analysis (DEA)models). Copyright Kluwer Academic Publishers 2000

Keywords: Returns to scale; DEA; FDH (search for similar items in EconPapers)
Date: 2000
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Citations: View citations in EconPapers (19)

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DOI: 10.1023/A:1026507205581

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