Measurement of carrier lifetime in micron-scaled materials using resonant microwave circuits

Sukrith Dev, Yinan Wang, Kyounghwan Kim, Marziyeh Zamiri, Clark Kadlec, Michael Goldflam, Samuel Hawkins, Eric Shaner, Jin Kim, Sanjay Krishna, Monica Allen, Jeffery Allen, Emanuel Tutuc and Daniel Wasserman ()
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Sukrith Dev: University of Texas at Austin
Yinan Wang: University of Texas at Austin
Kyounghwan Kim: University of Texas at Austin
Marziyeh Zamiri: University of Wisconsin
Clark Kadlec: Sandia National Laboratories
Michael Goldflam: Sandia National Laboratories
Samuel Hawkins: Sandia National Laboratories
Eric Shaner: Sandia National Laboratories
Jin Kim: Sandia National Laboratories
Sanjay Krishna: Ohio State University
Monica Allen: Munitions Directorate, Eglin Air Force Base
Jeffery Allen: Munitions Directorate, Eglin Air Force Base
Emanuel Tutuc: University of Texas at Austin
Daniel Wasserman: University of Texas at Austin

Nature Communications, 2019, vol. 10, issue 1, 1-7

Abstract: Abstract The measurement of minority carrier lifetimes is vital to determining the material quality and operational bandwidth of a broad range of optoelectronic devices. Typically, these measurements are made by recording the temporal decay of a carrier-concentration-dependent material property following pulsed optical excitation. Such approaches require some combination of efficient emission from the material under test, specialized collection optics, large sample areas, spatially uniform excitation, and/or the fabrication of ohmic contacts, depending on the technique used. In contrast, here we introduce a technique that provides electrical readout of minority carrier lifetimes using a passive microwave resonator circuit. We demonstrate >105 improvement in sensitivity, compared with traditional photoemission decay experiments and the ability to measure carrier dynamics in micron-scale volumes, much smaller than is possible with other techniques. The approach presented is applicable to a wide range of 2D, micro-, or nano-scaled materials, as well as weak emitters or non-radiative materials.

Date: 2019
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DOI: 10.1038/s41467-019-09602-2

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