Piezoresponse force microscopy and nanoferroic phenomena

Alexei Gruverman (), Marin Alexe and Dennis Meier
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Alexei Gruverman: University of Nebraska
Marin Alexe: University of Warwick
Dennis Meier: Norwegian University of Science and Technology (NTNU)

Nature Communications, 2019, vol. 10, issue 1, 1-9

Abstract: Abstract Since its inception more than 25 years ago, Piezoresponse Force Microscopy (PFM) has become one of the mainstream techniques in the field of nanoferroic materials. This review describes the evolution of PFM from an imaging technique to a set of advanced methods, which have played a critical role in launching new areas of ferroic research, such as multiferroic devices and domain wall nanoelectronics. The paper reviews the impact of advanced PFM modes concerning the discovery and scientific understanding of novel nanoferroic phenomena and discusses challenges associated with the correct interpretation of PFM data. In conclusion, it offers an outlook for future trends and developments in PFM.

Date: 2019
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DOI: 10.1038/s41467-019-09650-8

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