Coherent X-ray measurement of step-flow propagation during growth on polycrystalline thin film surfaces

Randall L. Headrick (), Jeffrey G. Ulbrandt, Peco Myint, Jing Wan, Yang Li, Andrei Fluerasu, Yugang Zhang, Lutz Wiegart and Karl F. Ludwig
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Randall L. Headrick: University of Vermont
Jeffrey G. Ulbrandt: University of Vermont
Peco Myint: Boston University
Jing Wan: University of Vermont
Yang Li: University of Vermont
Andrei Fluerasu: National Synchrotron Light Source II
Yugang Zhang: National Synchrotron Light Source II
Lutz Wiegart: National Synchrotron Light Source II
Karl F. Ludwig: Boston University

Nature Communications, 2019, vol. 10, issue 1, 1-9

Abstract: Abstract The properties of artificially grown thin films are strongly affected by surface processes during growth. Coherent X-rays provide an approach to better understand such processes and fluctuations far from equilibrium. Here we report results for vacuum deposition of C60 on a graphene-coated surface investigated with X-ray Photon Correlation Spectroscopy in surface-sensitive conditions. Step-flow is observed through measurement of the step-edge velocity in the late stages of growth after crystalline mounds have formed. We show that the step-edge velocity is coupled to the terrace length, and that there is a variation in the velocity from larger step spacing at the center of crystalline mounds to closely-spaced, more slowly propagating steps at their edges. The results extend theories of surface growth, since the behavior is consistent with surface evolution driven by processes that include surface diffusion, the motion of step-edges, and attachment at step edges with significant step-edge barriers.

Date: 2019
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DOI: 10.1038/s41467-019-10629-8

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