Ab initio nonrigid X-ray nanotomography

Michal Odstrcil, Mirko Holler, Jörg Raabe, Alessandro Sepe, Xiaoyuan Sheng, Silvia Vignolini, Christian G. Schroer and Manuel Guizar-Sicairos ()
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Michal Odstrcil: Paul Scherrer Institut, CH-5232
Mirko Holler: Paul Scherrer Institut, CH-5232
Jörg Raabe: Paul Scherrer Institut, CH-5232
Alessandro Sepe: Big Data Science Center, Shanghai Synchrotron Radiation Facility, Zhangjiang Laboratory
Xiaoyuan Sheng: Adolphe Merkle Institute, University of Fribourg
Silvia Vignolini: University of Cambridge
Christian G. Schroer: Deutsches Elektronen-Synchrotron DESY
Manuel Guizar-Sicairos: Paul Scherrer Institut, CH-5232

Nature Communications, 2019, vol. 10, issue 1, 1-9

Abstract: Abstract Reaching the full potential of X-ray nanotomography, in particular for biological samples, is limited by many factors, of which one of the most serious is radiation damage. Although sample deformation caused by radiation damage can be partly mitigated by cryogenic protection, it is still present in these conditions and, as we exemplify here using a specimen extracted from scales of the Cyphochilus beetle, it will pose a limit to the achievable imaging resolution. We demonstrate a generalized tomographic model, which optimally follows the sample morphological changes and attempts to recover the original sample structure close to the ideal, damage-free reconstruction. Whereas our demonstration was performed using ptychographic X-ray tomography, the method can be adopted for any tomographic imaging modality. Our application demonstrates improved reconstruction quality of radiation-sensitive samples, which will be of increasing relevance with the higher brightness of 4th generation synchrotron sources.

Date: 2019
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DOI: 10.1038/s41467-019-10670-7

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