Micro-/nano-voids guided two-stage film cracking on bioinspired assemblies for high-performance electronics
Weining Miao,
Yuxing Yao,
Zhiwei Zhang,
Chunping Ma,
Shengzhe Li,
Jiayue Tang,
He Liu,
Zemin Liu,
Dianyu Wang,
Michael A. Camburn,
Jen-Chun Fang,
Ruiran Hao,
Xinyu Fang,
Shuang Zheng (),
Nan Hu and
Xiaoguang Wang
Additional contact information
Weining Miao: Chinese Academy of Sciences
Yuxing Yao: Harvard University
Zhiwei Zhang: The Ohio State University
Chunping Ma: The Ohio State University
Shengzhe Li: Imperial College London
Jiayue Tang: Institute of Chemistry, Chinese Academy of Sciences
He Liu: University of Chinese Academy of Sciences
Zemin Liu: University of Chinese Academy of Sciences
Dianyu Wang: Jilin University
Michael A. Camburn: The Ohio State University
Jen-Chun Fang: The Ohio State University
Ruiran Hao: Institute of Chemistry, Chinese Academy of Sciences
Xinyu Fang: The Ohio State University
Shuang Zheng: Institute of Chemistry, Chinese Academy of Sciences
Nan Hu: The Ohio State University
Xiaoguang Wang: The Ohio State University
Nature Communications, 2019, vol. 10, issue 1, 1-8
Abstract:
Abstract Current metal film-based electronics, while sensitive to external stretching, typically fail via uncontrolled cracking under a relatively small strain (~30%), which restricts their practical applications. To address this, here we report a design approach inspired by the stereocilia bundles of a cochlea that uses a hierarchical assembly of interfacial nanowires to retard penetrating cracking. This structured surface outperforms its flat counterparts in stretchability (130% versus 30% tolerable strain) and maintains high sensitivity (minimum detection of 0.005% strain) in response to external stimuli such as sounds and mechanical forces. The enlarged stretchability is attributed to the two-stage cracking process induced by the synergy of micro-voids and nano-voids. In-situ observation confirms that at low strains micro-voids between nanowire clusters guide the process of crack growth, whereas at large strains new cracks are randomly initiated from nano-voids among individual nanowires.
Date: 2019
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DOI: 10.1038/s41467-019-11803-8
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