Mechanical cleaning of graphene using in situ electron microscopy

Peter Schweizer, Christian Dolle, Daniela Dasler, Gonzalo Abellán, Frank Hauke, Andreas Hirsch and Erdmann Spiecker ()
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Peter Schweizer: Institute of Micro- and Nanostructure Research (IMN) and Center for Nanoanalysis and Electron Microscopy (CENEM), FAU Erlangen-Nürnberg
Christian Dolle: Institute of Micro- and Nanostructure Research (IMN) and Center for Nanoanalysis and Electron Microscopy (CENEM), FAU Erlangen-Nürnberg
Daniela Dasler: Department of Chemistry and Pharmacy and Joint Institute of Advanced Materials and Processes (ZMP), Chair of Organic Chemistry II, FAU Erlangen-Nürnberg
Gonzalo Abellán: Department of Chemistry and Pharmacy and Joint Institute of Advanced Materials and Processes (ZMP), Chair of Organic Chemistry II, FAU Erlangen-Nürnberg
Frank Hauke: Department of Chemistry and Pharmacy and Joint Institute of Advanced Materials and Processes (ZMP), Chair of Organic Chemistry II, FAU Erlangen-Nürnberg
Andreas Hirsch: Department of Chemistry and Pharmacy and Joint Institute of Advanced Materials and Processes (ZMP), Chair of Organic Chemistry II, FAU Erlangen-Nürnberg
Erdmann Spiecker: Institute of Micro- and Nanostructure Research (IMN) and Center for Nanoanalysis and Electron Microscopy (CENEM), FAU Erlangen-Nürnberg

Nature Communications, 2020, vol. 11, issue 1, 1-9

Abstract: Abstract Avoiding and removing surface contamination is a crucial task when handling specimens in any scientific experiment. This is especially true for two-dimensional materials such as graphene, which are extraordinarily affected by contamination due to their large surface area. While many efforts have been made to reduce and remove contamination from such surfaces, the issue is far from resolved. Here we report on an in situ mechanical cleaning method that enables the site-specific removal of contamination from both sides of two dimensional membranes down to atomic-scale cleanliness. Further, mechanisms of re-contamination are discussed, finding surface-diffusion to be the major factor for contamination in electron microscopy. Finally the targeted, electron-beam assisted synthesis of a nanocrystalline graphene layer by supplying a precursor molecule to cleaned areas is demonstrated.

Date: 2020
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DOI: 10.1038/s41467-020-15255-3

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