Atomic imaging of mechanically induced topological transition of ferroelectric vortices

Pan Chen, Xiangli Zhong, Jacob A. Zorn, Mingqiang Li, Yuanwei Sun, Adeel Y. Abid, Chuanlai Ren, Yuehui Li, Xiaomei Li, Xiumei Ma, Jinbin Wang, Kaihui Liu, Zhi Xu, Congbing Tan (), Longqing Chen, Peng Gao () and Xuedong Bai ()
Additional contact information
Pan Chen: Institute of Physics, Chinese Academy of Sciences
Xiangli Zhong: Xiangtan University
Jacob A. Zorn: Penn State University
Mingqiang Li: Peking University
Yuanwei Sun: Peking University
Adeel Y. Abid: Peking University
Chuanlai Ren: Xiangtan University
Yuehui Li: Peking University
Xiaomei Li: Institute of Physics, Chinese Academy of Sciences
Xiumei Ma: Peking University
Jinbin Wang: Xiangtan University
Kaihui Liu: Peking University
Zhi Xu: Institute of Physics, Chinese Academy of Sciences
Congbing Tan: Hunan University of Science and Technology
Longqing Chen: Penn State University
Peng Gao: Peking University
Xuedong Bai: Institute of Physics, Chinese Academy of Sciences

Nature Communications, 2020, vol. 11, issue 1, 1-8

Abstract: Abstract Ferroelectric vortices formed through complex lattice–charge interactions have great potential in applications for future nanoelectronics such as memories. For practical applications, it is crucial to manipulate these topological states under external stimuli. Here, we apply mechanical loads to locally manipulate the vortices in a PbTiO3/SrTiO3 superlattice via atomically resolved in-situ scanning transmission electron microscopy. The vortices undergo a transition to the a-domain with in-plane polarization under external compressive stress and spontaneously recover after removal of the stress. We reveal the detailed transition process at the atomic scale and reproduce this numerically using phase-field simulations. These findings provide new pathways to control the exotic topological ferroelectric structures for future nanoelectronics and also valuable insights into understanding of lattice-charge interactions at nanoscale.

Date: 2020
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DOI: 10.1038/s41467-020-15616-y

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