Morphology and mobility as tools to control and unprecedentedly enhance X-ray sensitivity in organic thin-films

Inés Temiño, Laura Basiricò, Ilaria Fratelli, Adrián Tamayo, Andrea Ciavatti, Marta Mas-Torrent () and Beatrice Fraboni ()
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Inés Temiño: Institut de Ciència de Materials de Barcelona (ICMAB-CSIC)
Laura Basiricò: University of Bologna
Ilaria Fratelli: University of Bologna
Adrián Tamayo: Institut de Ciència de Materials de Barcelona (ICMAB-CSIC)
Andrea Ciavatti: University of Bologna
Marta Mas-Torrent: Institut de Ciència de Materials de Barcelona (ICMAB-CSIC)
Beatrice Fraboni: University of Bologna

Nature Communications, 2020, vol. 11, issue 1, 1-10

Abstract: Abstract Organic semiconductor materials exhibit a great potential for the realization of large-area solution-processed devices able to directly detect high-energy radiation. However, only few works investigated on the mechanism of ionizing radiation detection in this class of materials, so far. In this work we investigate the physical processes behind X-ray photoconversion employing bis-(triisopropylsilylethynyl)-pentacene thin-films deposited by bar-assisted meniscus shearing. The thin film coating speed and the use of bis-(triisopropylsilylethynyl)-pentacene:polystyrene blends are explored as tools to control and enhance the detection capability of the devices, by tuning the thin-film morphology and the carrier mobility. The so-obtained detectors reach a record sensitivity of 1.3 · 104 µC/Gy·cm2, the highest value reported for organic-based direct X-ray detectors and a very low minimum detectable dose rate of 35 µGy/s. Thus, the employment of organic large-area direct detectors for X-ray radiation in real-life applications can be foreseen.

Date: 2020
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DOI: 10.1038/s41467-020-15974-7

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