Quantifying microscale drivers for fatigue failure via coupled synchrotron X-ray characterization and simulations

Sven Gustafson, Wolfgang Ludwig, Paul Shade, Diwakar Naragani, Darren Pagan, Phil Cook, Can Yildirim, Carsten Detlefs and Michael D. Sangid ()
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Sven Gustafson: Purdue University
Wolfgang Ludwig: University Lyon I
Paul Shade: Air Force Research Laboratory
Diwakar Naragani: Purdue University
Darren Pagan: Cornell High Energy Synchrotron Source
Phil Cook: European Synchrotron Radiation Facility
Can Yildirim: European Synchrotron Radiation Facility
Carsten Detlefs: European Synchrotron Radiation Facility
Michael D. Sangid: Purdue University

Nature Communications, 2020, vol. 11, issue 1, 1-10

Abstract: Abstract During cyclic loading, localization of intragranular deformation due to crystallographic slip acts as a precursor for crack initiation, often at coherent twin boundaries. A suite of high-resolution synchrotron X-ray characterizations, coupled with a crystal plasticity simulation, was conducted on a polycrystalline nickel-based superalloy microstructure near a parent-twin boundary in order to understand the deformation localization behavior of this critical, 3D microstructural configuration. Dark-field X-ray microscopy was spatially linked to high energy X-ray diffraction microscopy and X-ray diffraction contrast tomography in order to quantify, with cutting-edge resolution, an intragranular misorientation and high elastic strain gradients near a twin boundary. These observations quantify the extreme sub-grain scale stress gradients present in polycrystalline microstructures, which often lead to fatigue failure.

Date: 2020
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DOI: 10.1038/s41467-020-16894-2

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