Attosecond electronic timing with rising edges of photocurrent pulses

Minji Hyun, Changmin Ahn, Yongjin Na, Hayun Chung () and Jungwon Kim ()
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Minji Hyun: Korea Advanced Institute of Science and Technology (KAIST)
Changmin Ahn: Korea Advanced Institute of Science and Technology (KAIST)
Yongjin Na: Korea Advanced Institute of Science and Technology (KAIST)
Hayun Chung: Korea University
Jungwon Kim: Korea Advanced Institute of Science and Technology (KAIST)

Nature Communications, 2020, vol. 11, issue 1, 1-9

Abstract: Abstract There has been remarkable progress in generating ultralow-noise microwaves from optical frequency combs in the last decade. While a combination of techniques has enabled tens to hundreds of attoseconds residual jitter in microwave extraction, so far most of research efforts have been focused on extracting single-tone microwaves from combs; there has been no study on the noise properties of photocurrent pulses directly extracted from the photodiode. Here, we reveal that the residual jitter between optical pulses and rising edges of photocurrent pulses can be in the tens of attoseconds regime. The rising-edge jitter is much lower than the falling-edge jitter, and further, this ultralow rising-edge jitter could be obtained by both p-i-n and (modified-)uni-travelling-carrier photodiodes. This finding can be directly used for various edge-sensitive timing applications, and further shows the potential for ultrahigh-precision timing using silicon-photonic-integrable on-chip p-i-n photodiodes.

Date: 2020
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DOI: 10.1038/s41467-020-17460-6

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