Distilling nanoscale heterogeneity of amorphous silicon using tip-enhanced Raman spectroscopy (TERS) via multiresolution manifold learning
Guang Yang (),
Xin Li (),
Yongqiang Cheng,
Mingchao Wang,
Dong Ma,
Alexei P. Sokolov,
Sergei V. Kalinin,
Gabriel M. Veith and
Jagjit Nanda ()
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Guang Yang: Oak Ridge National Laboratory
Xin Li: Oak Ridge National Laboratory
Yongqiang Cheng: Oak Ridge National Laboratory
Mingchao Wang: Monash University
Dong Ma: Oak Ridge National Laboratory
Alexei P. Sokolov: Oak Ridge National Laboratory
Sergei V. Kalinin: Oak Ridge National Laboratory
Gabriel M. Veith: Oak Ridge National Laboratory
Jagjit Nanda: Oak Ridge National Laboratory
Nature Communications, 2021, vol. 12, issue 1, 1-11
Abstract:
Abstract Accurately identifying the local structural heterogeneity of complex, disordered amorphous materials such as amorphous silicon is crucial for accelerating technology development. However, short-range atomic ordering quantification and nanoscale spatial resolution over a large area on a-Si have remained major challenges and practically unexplored. We resolve phonon vibrational modes of a-Si at a lateral resolution of
Date: 2021
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Persistent link: https://EconPapers.repec.org/RePEc:nat:natcom:v:12:y:2021:i:1:d:10.1038_s41467-020-20691-2
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DOI: 10.1038/s41467-020-20691-2
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