Topological phase singularities in atomically thin high-refractive-index materials

Georgy Ermolaev, Kirill Voronin, Denis G. Baranov, Vasyl Kravets, Gleb Tselikov, Yury Stebunov, Dmitry Yakubovsky, Sergey Novikov, Andrey Vyshnevyy, Arslan Mazitov, Ivan Kruglov, Sergey Zhukov, Roman Romanov, Andrey M. Markeev, Aleksey Arsenin, Kostya S. Novoselov, Alexander N. Grigorenko and Valentyn Volkov ()
Additional contact information
Georgy Ermolaev: Moscow Institute of Physics and Technology
Kirill Voronin: Moscow Institute of Physics and Technology
Denis G. Baranov: Moscow Institute of Physics and Technology
Vasyl Kravets: University of Manchester
Gleb Tselikov: Moscow Institute of Physics and Technology
Yury Stebunov: University of Manchester
Dmitry Yakubovsky: Moscow Institute of Physics and Technology
Sergey Novikov: Moscow Institute of Physics and Technology
Andrey Vyshnevyy: Moscow Institute of Physics and Technology
Arslan Mazitov: Moscow Institute of Physics and Technology
Ivan Kruglov: Moscow Institute of Physics and Technology
Sergey Zhukov: Moscow Institute of Physics and Technology
Roman Romanov: National Research Nuclear University MEPhI (Moscow Engineering Physics Institute)
Andrey M. Markeev: Moscow Institute of Physics and Technology
Aleksey Arsenin: Moscow Institute of Physics and Technology
Kostya S. Novoselov: University of Manchester
Alexander N. Grigorenko: University of Manchester
Valentyn Volkov: Moscow Institute of Physics and Technology

Nature Communications, 2022, vol. 13, issue 1, 1-9

Abstract: Abstract Atomically thin transition metal dichalcogenides (TMDCs) present a promising platform for numerous photonic applications due to excitonic spectral features, possibility to tune their constants by external gating, doping, or light, and mechanical stability. Utilization of such materials for sensing or optical modulation purposes would require a clever optical design, as by itself the 2D materials can offer only a small optical phase delay – consequence of the atomic thickness. To address this issue, we combine films of 2D semiconductors which exhibit excitonic lines with the Fabry-Perot resonators of the standard commercial SiO2/Si substrate, in order to realize topological phase singularities in reflection. Around these singularities, reflection spectra demonstrate rapid phase changes while the structure behaves as a perfect absorber. Furthermore, we demonstrate that such topological phase singularities are ubiquitous for the entire class of atomically thin TMDCs and other high-refractive-index materials, making it a powerful tool for phase engineering in flat optics. As a practical demonstration, we employ PdSe2 topological phase singularities for a refractive index sensor and demonstrate its superior phase sensitivity compared to typical surface plasmon resonance sensors.

Date: 2022
References: View references in EconPapers View complete reference list from CitEc
Citations:

Downloads: (external link)
https://www.nature.com/articles/s41467-022-29716-4 Abstract (text/html)

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:nat:natcom:v:13:y:2022:i:1:d:10.1038_s41467-022-29716-4

Ordering information: This journal article can be ordered from
https://www.nature.com/ncomms/

DOI: 10.1038/s41467-022-29716-4

Access Statistics for this article

Nature Communications is currently edited by Nathalie Le Bot, Enda Bergin and Fiona Gillespie

More articles in Nature Communications from Nature
Bibliographic data for series maintained by Sonal Shukla () and Springer Nature Abstracting and Indexing ().