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Simultaneous single-qubit driving of semiconductor spin qubits at the fault-tolerant threshold

W. I. L. Lawrie, M. Rimbach-Russ, F. van Riggelen, N. W. Hendrickx, S. L. de Snoo, A. Sammak, G. Scappucci, J. Helsen and M. Veldhorst ()
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W. I. L. Lawrie: Delft University of Technology
M. Rimbach-Russ: Delft University of Technology
F. van Riggelen: Delft University of Technology
N. W. Hendrickx: Delft University of Technology
S. L. de Snoo: Delft University of Technology
A. Sammak: QuTech and Netherlands Organisation for Applied Scientific Research (TNO)
G. Scappucci: Delft University of Technology
J. Helsen: QuSoft and CWI
M. Veldhorst: Delft University of Technology

Nature Communications, 2023, vol. 14, issue 1, 1-7

Abstract: Abstract Practical Quantum computing hinges on the ability to control large numbers of qubits with high fidelity. Quantum dots define a promising platform due to their compatibility with semiconductor manufacturing. Moreover, high-fidelity operations above 99.9% have been realized with individual qubits, though their performance has been limited to 98.67% when driving two qubits simultaneously. Here we present single-qubit randomized benchmarking in a two-dimensional array of spin qubits, finding native gate fidelities as high as 99.992(1)%. Furthermore, we benchmark single qubit gate performance while simultaneously driving two and four qubits, utilizing a novel benchmarking technique called N-copy randomized benchmarking, designed for simple experimental implementation and accurate simultaneous gate fidelity estimation. We find two- and four-copy randomized benchmarking fidelities of 99.905(8)% and 99.34(4)% respectively, and that next-nearest neighbor pairs are highly robust to cross-talk errors. These characterizations of single-qubit gate quality are crucial for scaling up quantum information technology.

Date: 2023
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DOI: 10.1038/s41467-023-39334-3

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