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A reconfigurable binary/ternary logic conversion-in-memory based on drain-aligned floating-gate heterojunction transistors

Chungryeol Lee, Changhyeon Lee, Seungmin Lee, Junhwan Choi, Hocheon Yoo () and Sung Gap Im ()
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Chungryeol Lee: Department of Chemical and Biomolecular Engineering, Korea Advanced Institute of Science and Technology (KAIST)
Changhyeon Lee: Department of Chemical and Biomolecular Engineering, Korea Advanced Institute of Science and Technology (KAIST)
Seungmin Lee: Department of Chemical and Biomolecular Engineering, Korea Advanced Institute of Science and Technology (KAIST)
Junhwan Choi: Department of Chemical Engineering, Dankook University
Hocheon Yoo: Department of Electronic Engineering, Gachon University
Sung Gap Im: Department of Chemical and Biomolecular Engineering, Korea Advanced Institute of Science and Technology (KAIST)

Nature Communications, 2023, vol. 14, issue 1, 1-11

Abstract: Abstract A new type of heterojunction non-volatile memory transistor (H-MTR) has been developed, in which the negative transconductance (NTC) characteristics can be controlled systematically by a drain-aligned floating gate. In the H-MTR, a reliable transition between N-shaped transfer curves with distinct NTC and monolithically current-increasing transfer curves without apparent NTC can be accomplished through programming operation. Based on the H-MTR, a binary/ternary reconfigurable logic inverter (R-inverter) has been successfully implemented, which showed an unprecedentedly high static noise margin of 85% for binary logic operation and 59% for ternary logic operation, as well as long-term stability and outstanding cycle endurance. Furthermore, a ternary/binary dynamic logic conversion-in-memory has been demonstrated using a serially-connected R-inverter chain. The ternary/binary dynamic logic conversion-in-memory could generate three different output logic sequences for the same input signal in three logic levels, which is a new logic computing method that has never been presented before.

Date: 2023
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DOI: 10.1038/s41467-023-39394-5

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