Lorentz microscopy of optical fields

John H. Gaida, Hugo Lourenço-Martins, Sergey V. Yalunin, Armin Feist, Murat Sivis, Thorsten Hohage, F. Javier García de Abajo and Claus Ropers ()
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John H. Gaida: Max Planck Institute for Multidisciplinary Sciences
Hugo Lourenço-Martins: Max Planck Institute for Multidisciplinary Sciences
Sergey V. Yalunin: Max Planck Institute for Multidisciplinary Sciences
Armin Feist: Max Planck Institute for Multidisciplinary Sciences
Murat Sivis: Max Planck Institute for Multidisciplinary Sciences
Thorsten Hohage: University of Göttingen
F. Javier García de Abajo: The Barcelona Institute of Science and Technology
Claus Ropers: Max Planck Institute for Multidisciplinary Sciences

Nature Communications, 2023, vol. 14, issue 1, 1-8

Abstract: Abstract In electron microscopy, detailed insights into nanoscale optical properties of materials are gained by spontaneous inelastic scattering leading to electron-energy loss and cathodoluminescence. Stimulated scattering in the presence of external sample excitation allows for mode- and polarization-selective photon-induced near-field electron microscopy (PINEM). This process imprints a spatial phase profile inherited from the optical fields onto the wave function of the probing electrons. Here, we introduce Lorentz-PINEM for the full-field, non-invasive imaging of complex optical near fields at high spatial resolution. We use energy-filtered defocus phase-contrast imaging and iterative phase retrieval to reconstruct the phase distribution of interfering surface-bound modes on a plasmonic nanotip. Our approach is universally applicable to retrieve the spatially varying phase of nanoscale fields and topological modes.

Date: 2023
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DOI: 10.1038/s41467-023-42054-3

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